Paleomagnetism Of The Mesozoic In Alaska

Thesis (Ph.D.) University of Alaska Fairbanks, 197

Urban snow hazard: Economic and social implications

U.S. Department of the InteriorU.S. Geological SurveyOpe

The simultans test vs. the near cylinder test

The simultans test vs. the near cylinder tes

The radicular origin of the nerves of the lumbosacral plexus of the Bos taurus

Call number: LD2668 .T4 1959 P4

Comment on "Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches" [Appl. Phys. Lett. 92, 043502 (2008)]

The purpose of this comment is to provide additional insight into the reliability of microelectromechanical capacitive switches (MEMSs) investigated by Molinero and Casta er [Appl. Phys. Lett. 92, 043502 (2008)]. We show that the presence or absence of ambient humidity determines whether the shift in the capacitance-voltage (C-V) curve of oxide-based MEMS occurs as a result of voltage stress. In humid air, negative and positive shifts in the C-V curve are observed after negative and positive bias stress. In dry air no such shifts in the C-V curve are seen. These shifts are similar to those reported on oxide-based switches by Molinero and Castaner [Appl. Phys. Lett. 92, 043502 (2008)] where they show shifts occurring in room ambient pressure, but not in vacuum. This indicates that not only air pressure but also air humidity can be responsible for shifts in MEMS. (C) 2009 American Institute of Physics. (doi: 10.1063/1.3255008

Psalms and Work

Introduction to Psalms Book 1 (Psalms 1–41) Personal Integrity in Work (Psalm 1) Obedience to God (Psalm 2) Foes and opponents (Psalms 4, 6, 7, 17) Authority (Psalm 8) Business ethics (Psalms 15, 24, 34) Trusting God in the face of institutional pressure (Psalm 20) God’s presence in our struggles at work (Psalm 23) God’s guidance in our work (Psalm 25) Book 2 (Psalms 42–72) God’s presence in the midst of disaster (Psalm 46) Anxiety when unscrupulous people succeed (Psalms 49, 50, 52, 62) Book 3 (Psalms 73–89) The workplace consequences of personal failings (Psalm 73) The economic consequences of national wrongdoings (Psalm 81, 85) God’s grace in the midst of judgment (Psalm 86) Book 4 (Psalms 90–106) Working in a fallen world (Psalms 90, 101) Human creativity with God (Psalm 104) Book 5 (Psalms 107–150) God undergirds all work and productivity (Psalm 107) Virtues for those in business (Psalm 112) Participating in God’s work (Psalm 113) Producing true value at work (Psalms 127) The work of marriage, raising children, and caring for parents (Psalm 127, 128, 139) The right use of power (Psalm 136) God’s glory in all of creation (Psalm 146-150) Psalm 146 Psalm 147 Psalm 149 Psalm 148 Psalm 15

A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches

A bipolar hold-down voltage was used to study mechanical degradation in radio-frequency microelectromechanical capacitive shunt switches. The bipolar signal was used to prevent the occurrence of dielectric charging and to isolate mechanical effects. The characteristics of material stress relaxation and recovery were monitored by recording the change of the pull-in voltage of a device. The creep effect in movable components was saturated by repeated actuation to the pulled-in position, while comparison with a theoretical model confirmed the presence of linear viscoelasticity in the devices. (C) 2014 AIP Publishing LLC

Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches

DC and bipolar voltage stresses are used to isolate mechanical degradation of the movable electrode from charging mechanism in microelectromechanical capacitive switches. Switches with different metals as the movable electrode were investigated. In titanium switches, a shift in the pull-in voltages is observed after dc stressing whereas no shift occurs after the bipolar stressing, which is to be expected from charging theory. On switches with similar dielectric but made of aluminium, the narrowing effect occurs regardless if dc or bipolar stressing is used, which indicates the mechanical degradation as the mechanism responsible. (C) 2012 American Institute of Physics. (http://dx.doi.org/10.1063/1.4726116